Scope of Application
【Operating Instructions】
Used to determine the peeling strength of various fusible interlinings, coated fabrics, and composite functional fabrics.
FZ/T 01085
FZ/T 01010
FZ/T 60011
FZ/T 80007.1
ASTM D2724
ASTM D3936
AATCC 136, etc.
Control System: Controlled by a Philips 16-bit industrial-grade Microcontroller Unit (MCU) and an Analog Devices (USA) 16-bit A/D converter, offering strong anti-interference capability and fast data processing/transmission.
Sampling: Dynamic sampling frequency reaches 1000 times/sec, accurately capturing peak data values during the testing process.
Interface: LCD display with a full Chinese menu for easy operation.
Drive Mechanism: Driven by an imported stepper motor control system and transmitted via a ball screw.
Safety: Equipped with multiple protections including overload, over-travel, over-voltage, and over-heat protection to ensure safe and reliable operation.
Force Measurement Range: 0 - 8000 cN (Full Scale: 1 - 100%).
Force Measurement Accuracy: ≤ ±0.2% F.S.
Running Speed: 1 ~ 500 mm/min (arbitrarily settable).
Return Speed: 1 ~ 500 mm/min (arbitrarily settable).
Sampling Frequency: 1000 times/sec.
Force Unit: cN (Centinewton).
Power Supply: AC 220V ±10%, 50Hz.
Imported stepper motor control system.
Philips 16-bit industrial-grade MCU.
Analog Devices (USA) 16-bit A/D converter.
High-precision domestic dynamic sensor.
Precision ball screw.
Panasonic dot matrix printer (Optional).
Computer interface and operation software (Optional).
Parameter Setting: Users can set parameters such as specimen programming, batch number, temperature, and humidity, which are then saved in the test report.
Curve Zoom: The test curve supports point selection for zooming; clicking any point on the curve displays the peeling strength and peeling length values.
Data Export: Test data reports can be converted to Word documents and saved on the computer.
Archiving: Test curves can be saved to the computer for record-keeping and inquiry.
Open Platform: An open program allows users to edit corresponding test methods.